Application of Infrared Spectroscopy Method in Diagnosis on Potential Fault of Damaged Silicon Insulator in SF6 Electrical Equipment

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Application of Infrared Spectroscopy Method in Diagnosis on Potential Fault of Damaged Silicon Insulator in SF6 Electrical Equipment

- Application of Infrared Spectroscopy Method in Diagnosis on Potential Fault of Damaged Silicon Insulator in SF6 Electrical Equipment
- Vol. 35, Issue 8, Pages: 1058-1061(2016)
- 作者机构：
  
  1. 国网陕西省电力公司电力科学研究院
  2. 中国广州分析测试中心
- 作者简介：
- 基金信息：
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Application of Infrared Spectroscopy Method in Diagnosis on Potential Fault of Damaged Silicon Insulator in SF6 Electrical Equipment. [J]. 35(8):1058-1061(2016)
DOI：

Application of Infrared Spectroscopy Method in Diagnosis on Potential Fault of Damaged Silicon Insulator in SF6 Electrical Equipment. [J]. 35(8):1058-1061(2016) DOI：

摘要

利用红外光谱法对SF6设备故障气体中的SiF4进行定性、定量检测，该方法的线性范围为10~500 μL/L，检出限为1 μL/L，此方法可以较理想地判断出设备内含硅元素绝缘材料的受损情况。应用于现场SF6气体绝缘开关类设备的潜伏性故障诊断，验证了分解产物SiF4对设备内部工况诊断的有效性。

Abstract

SiF4 was qualitatively and quantitatively analyzed by Fourier transferred infrared spectroscopy.The linear range for the method was 10-500 μL/L,and the detection limit was 1 μL/L.The method was applied in the potential fault diagnosis of SF6 gas insulated switch,and the effectiveness of the SiF4 in the diagnosis of the internal conditions in the equipment was verified.

关键词

高压绝缘设备红外光谱分析SF6气体分解产物SiF4 检测

Keywords

high voltage insulation equipmentFourier infrared spectroscopic analysisSF6 decomposition productSiF4 detectionSF6

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